MIICuDCCAaCgAwIBAgIEUdwYxzANBgkqhkiG9w0BAQUFADAeMRwwGgYDVQQDExNpZWVleHBsb3Jl LmllZWUub3JnMB4XDTEzMDcwOTE0MDU1OVoXDTE2MDcwODE0MDU1OVowHjEcMBoGA1UEAxMTaWVl ZXhwbG9yZS5pZWVlLm9yZzCCASIwDQYJKoZIhvcNAQEBBQADggEPADCCAQoCggEBAOA75zEbFib1 oKwcgYsUgZh/RGIYQKeVLG96sghJd0VvxeMKq0hgF7/jWjXPUqcHCTjNg50joOH4nAjlvRZ81Iw0 cKyMmnaucv8scBnBfUwQjfkVOyUW3IxizoH66RLVXJvq8knRbB+d25kLDcA0Wsby/RIMGkF5TJK5 Py6GBXF5VqH+E41ZvJNagkd2LiOc+oW9m/1df8MhcS02m1foWeJeax8GA4lyeGGTXCk3G3KO1PCz wc3UZqsaM3l2golNWx3eRqWKVjEj59+IkChkHm7MHnerKoWq+1EG/VbNnkTNn1AzRmqtcmMuSte6 6aEyGsZ6UTPjOKNIDnBnKT1PRmUCAwEAATANBgkqhkiG9w0BAQUFAAOCAQEAD1f85Q5nzBzUOUIl nftTsixhHhQOm6KNUxP6O2VGfbnkjikn972e3ypMtBxkloQTOyEti/qWw3tIvnadgKpQazkDGSMh 1RR6yJc2MWkuaah4rMET34XshUg7oQBRFThYrtX9g0yU3Sbriy2mRayz5+C51XF5U/lUKvepeBAQ 8T/5jnXGN2Acfi2r/QYSK8uPnnzuwPYlhTicyN2khwhBjokYXy/HEW1OjFe2VPmcKROPEwMkeNHD ite5CXfTutjiX6Wlmy2iiCp09SzEy2Zfan4iMf8hgdD/8994EkEQSYluvKKl+tc0BwdpKxxuoNke xhXvRxt/N3hR1GDsAZjQow== The Institute of Electrical And Electronics Engineers, Incorporated IEEE XploreDigital Library http://www.ieee.org/ Don Caldwell mailto:d.caldwell@ieee.org Mehul Trivedi mailto:mh.trivedi@ieee.org